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Optical Engineering

Alternative To Ellipsometry For Characterizing Transparent Planar Thin Films
Author(s): A. R. Reisinger; H. B. Morris; K. L. Lawley
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Paper Details

Date Published: 1 February 1981
PDF: 4 pages
Opt. Eng. 20(1) doi: 10.1117/12.7972673
Published in: Optical Engineering Volume 20, Issue 1
Show Author Affiliations
A. R. Reisinger, Exxon Enterprises, Inc. (United States)
H. B. Morris, Texas Instruments Incorporated (United States)
K. L. Lawley, Texas Instruments Incorporated (United States)

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