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Optical Engineering

Polarimetry Applied To Alignment And Angle Measurement
Author(s): R. J. King; K. W. Raine
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Paper Abstract

Factors limiting the sensitivity of measurement obtainable with polarimetric instrumentation are discussed, with particular emphasis on modulation methods and the special problems associated with a coherent light source. Under optimum conditions the peak noise level of a Faraday-effect polarimeter with a He-Ne laser source has been found to be as low as ± 0.05 second of arc. The addition of quartz wedge units enables lateral displacements and departures from straightness to be measured and a system is described that possesses low sensitivity to laser beam direction changes and air turbulence. Profile measurements on a silica bar using this polarimetric system and measurements by precise Fizeau interferometry have agreed to better than 0.2 um over the 300 mm length of the bar.

Paper Details

Date Published: 1 February 1981
PDF: 5 pages
Opt. Eng. 20(1) 200139 doi: 10.1117/12.7972659
Published in: Optical Engineering Volume 20, Issue 1
Show Author Affiliations
R. J. King, National Physical Laboratory (England)
K. W. Raine, National Physical Laboratory (England)

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