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Optical Engineering

The Scanning Fizeau Interferometer: An Automated Instrument For Characterizing Optical Surfaces
Author(s): J. M. Eastman
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Paper Details

Date Published: 1 December 1980
PDF: 5 pages
Opt. Eng. 19(6) doi: 10.1117/12.7972616
Published in: Optical Engineering Volume 19, Issue 6
Show Author Affiliations
J. M. Eastman, University of Rochester (United States)


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