Share Email Print

Optical Engineering

Heterodyne Interferometric Method For Profiling Recorded Moire Interferograms
Author(s): R. N. Shagam
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

This paper describes a method by which recorded moire interferog rams of diffuse, nonoptical surfaces may be processed using the principle of optical phase measurement by heterodyne interferometry. In this method, a moire interferogram is recorded and processed as a transparency. The resulting interferogram is equivalent to a low spatial frequency optical hologram. An optical wavefront whose phase variations are proportional to the original surface height variations can be reconstructed from a plane wavefront and interfered with a second coherent plane wavefront of slightly different optical frequency, resulting in an interferogram appropriate for measurement by temporal electronic phase measurement. The results compare favorably to direct contact measurements.

Paper Details

Date Published: 1 December 1980
PDF: 4 pages
Opt. Eng. 19(6) 196806 doi: 10.1117/12.7972615
Published in: Optical Engineering Volume 19, Issue 6
Show Author Affiliations
R. N. Shagam, Rockwell International Corporation (United States)

© SPIE. Terms of Use
Back to Top