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Optical Engineering

Double-Beam Interferometers For Analysis Of Thin Films
Author(s): Joseph Shamir
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Paper Details

Date Published: 1 December 1980
PDF: -800 pages
Opt. Eng. 19(6) doi: 10.1117/12.7972614
Published in: Optical Engineering Volume 19, Issue 6
Show Author Affiliations
Joseph Shamir, Israel Institute of Technology (Israel)

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