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Optical Engineering

Interference Method For Measurement Of Thickness Variations In Thin Liquid Films
Author(s): L. R. Fisher; N. S. Parker; F. Sharpies
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Paper Abstract

An instrument is described for measuring the thickness of thin liquid films by measurements of the irradiance in the reflected interference close to the central dark fringe. Variations in thickness can be measured by scanning a focused spot across the sample or an aperture across its image. The instrument has been tested on thin wedges.

Paper Details

Date Published: 1 December 1980
PDF: 3 pages
Opt. Eng. 19(6) 196798 doi: 10.1117/12.7972613
Published in: Optical Engineering Volume 19, Issue 6
Show Author Affiliations
L. R. Fisher, CSIRO (Australia)
N. S. Parker, CSIRO (Australia)
F. Sharpies, CSIRO (Australia)


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