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Optical Engineering

Specularity Measurements For Solar Materials
Author(s): M. A. Lind; J. S. Hartman; H. L. Hampton
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Paper Abstract

A technique using Fourier transform analysis which is suitable for measuring the specularity of solar glass components in the mrad and sub-mrad is discussed and demonstrated. A brief mathematical background as well as illustrative examples are included. A number of methods for image analysis are discussed with particular emphasis given to electronic integrating detectors. Typical Fourier plane image distributions are given for a few common solar utilization materials, and details of the instrument used to produce the images are considered. The limitations and capabilities of various instruments are outlined along with methods for further enhancing the utility and sensitivity of the technique.

Paper Details

Date Published: 1 August 1980
PDF: 5 pages
Opt. Eng. 19(4) 194551 doi: 10.1117/12.7972557
Published in: Optical Engineering Volume 19, Issue 4
Show Author Affiliations
M. A. Lind, Battelle (United States)
J. S. Hartman, Battelle (United States)
H. L. Hampton, Battelle (United States)

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