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Optical Engineering

Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied To Background Suppression
Author(s): George A. Vanasse; Roy W. Esplin; Ronald J. Huppi
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Paper Abstract

A method of using the SIMS (the Selective Modulation Interferometric Spectrometer) to measure the difference between the spectral content of two optical beams is given. The differencing is done optically; that is, the modulated detector signal is directly proportional to the difference between the two spectra being compared. This optical differencing minimizes the dynamic-range requirements of the electronics and requires only a simple modification of the basic cyclic SIMS spectrometer. This technique can be used to suppress background radiation for the enhancement of target detection and tracking. Laboratory measurements demonstrating the application of this technique are reported.

Paper Details

Date Published: 1 August 1979
PDF: 6 pages
Opt. Eng. 18(4) 184403 doi: 10.1117/12.7972395
Published in: Optical Engineering Volume 18, Issue 4
Show Author Affiliations
George A. Vanasse, Air Force Geophysics Laboratory (United States)
Roy W. Esplin, Utah State University (United States)
Ronald J. Huppi, Utah State University (United States)

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