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Optical Engineering

Selective Modulation Interferometric Spectrometer (SIMS) Technique Applied To Background Suppression
Author(s): George A. Vanasse; Roy W. Esplin; Ronald J. Huppi
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Paper Details

Date Published: 1 August 1979
PDF: 6 pages
Opt. Eng. 18(4) doi: 10.1117/12.7972395
Published in: Optical Engineering Volume 18, Issue 4
Show Author Affiliations
George A. Vanasse, Air Force Geophysics Laboratory (United States)
Roy W. Esplin, Utah State University (United States)
Ronald J. Huppi, Utah State University (United States)

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