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Optical Engineering

The Angle-Scanned Interferometer
Author(s): Robert Crane, Jr.
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Paper Abstract

Angle-scanned interferometers are a class of ac interferometers in which the optical path difference is varied as a function of time by varying the incidence angle. The resulting interferogram has the properties of a hologram of a point source and may be used to determine the input energy wavelength and incidence angle. A new category of interferometer type is suggested, beam symmetry, which determines the output fringe pattern behavior as a function of input angle. An interference circle diagram is presented as an aid to understanding the characteristic response of symmetrical interferometers and angle-scanned interferometers. A number of angle-scanned interferometer examples are described in terms of the interference circle diagram.

Paper Details

Date Published: 1 April 1979
PDF: 7 pages
Opt. Eng. 18(2) 182205 doi: 10.1117/12.7972351
Published in: Optical Engineering Volume 18, Issue 2
Show Author Affiliations
Robert Crane, Jr., The Perkin-Elmer Corporation (United States)

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