Share Email Print

Optical Engineering

Relationship between Surface Scattering and Microtopographic Features
Author(s): E. L. Church; H. A. Jenkinson; J. M. Zavada
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the smooth-surface limit, the angular distribution of the light scattered from a surface maps the power spectral density of its residual surface roughness. This result is essentially independent of the scattering theory used and the statistical properties of the surface roughness. The power spectral densities of engineering surfaces are generally broad and increase with increasing spatial wavelength. As a result, practical surface finish parameters are not intrinsic properties of the surface, but depend, with varying degrees of sensitivity, on the bandwidth limits inherent in their measurement or dictated by their application. These issues are discussed with reference to two classes of finish parameters: those related to the central moments of the scattering spectrum, and those related to the coefficients in the expansion of the shape of the spectrum in inverse powers of the scattering angle. The significance of "1/02" scattering in this context is emphasized. A shot model of surface roughness is then introduced to gain further insight into the relationship between scattering and surface features. In this model inverse power terms are related to "edge" scattering effects from critical points in various types of elemental microdefects. The relationship between this view and electronic noise is pointed out; in particular, the correspondence between "1/02" scattering and "1/f" or flicker-noise phenomena.

Paper Details

Date Published: 1 April 1979
PDF: 12 pages
Opt. Eng. 18(2) 182125 doi: 10.1117/12.7972337
Published in: Optical Engineering Volume 18, Issue 2
Show Author Affiliations
E. L. Church, U. S. Army Armament Research and Development Command (United States)
H. A. Jenkinson, U. S. Army Armament Research and Development Command (United States)
J. M. Zavada, U. S. Army Armament Research and Development Command (United States)

© SPIE. Terms of Use
Back to Top