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Optical Engineering

A Simple Optical Noncontact Profilometer
Author(s): G.
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Paper Abstract

A simple noncontact optical profilometer is described. Two light spots are scanned respectively over the shape to be measured and over a reference surface. The difference of elevation between the two surfaces is calculated from the time delay between the two pulses received by an image plane detector. Carefully calibrated, the method offers the possibility of a fast, precise and easily automated measurement. Feasibility experiments are presented which describe the application of the method to the control of small mechanical pieces (~cm) and the measurement of large objects (~m).

Paper Details

Date Published: 1 February 1979
PDF: 4 pages
Opt. Eng. 18(1) 180163 doi: 10.1117/12.7972321
Published in: Optical Engineering Volume 18, Issue 1
Show Author Affiliations
G., University of Berne (Switzerland)

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