Share Email Print
cover

Optical Engineering

Use of the Fast Fourier Transform in Evaluation of Laser Raman and Fluorescence Decay Times
Author(s): C. N. Bressel; S. R. Wisotsky; W. E. Vander Velde
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Details

Date Published: 1 April 1978
PDF: 3 pages
Opt. Eng. 17(2) doi: 10.1117/12.7972202
Published in: Optical Engineering Volume 17, Issue 2
Show Author Affiliations
C. N. Bressel, Avco Everett Research Laboratory, Inc. (United States)
S. R. Wisotsky, Avco Everett Research Laboratory, Inc. (United States)
W. E. Vander Velde, Massachusetts Institute of Technology (United States)


© SPIE. Terms of Use
Back to Top