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Optical Engineering

Application of Dynalyzer II to X-Ray Quality Control
Author(s): Jonathan S. Shapiro; Anthony J. Pellegrino; Vincent Berluti
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Paper Details

Date Published: 1 April 1978
PDF: 4 pages
Opt. Eng. 17(2) doi: 10.1117/12.7972198
Published in: Optical Engineering Volume 17, Issue 2
Show Author Affiliations
Jonathan S. Shapiro, The Machlett Laboratories, Inc. (United States)
Anthony J. Pellegrino, The Machlett Laboratories, Inc.. (United States)
Vincent Berluti, The Machlett Laboratories, Inc.. (United States)

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