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Optical Engineering

The Selective Modulation Interferometric Spectrometer
Author(s): Roy W. Esplin
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Paper Abstract

This paper reviews the theory and the practical implementation of the selective modulation interferometric spectrometer (the SIMS). This spectrometer has an extremely large optical throughput, and it can scan the spectrum in real time while requiring no more signal processing than a chopped radiometer. Equations are presented which describe the relationship between design parameters and spectrometer performance. Practical design problems are identified, and some solutions to these problems are given.

Paper Details

Date Published: 1 February 1978
PDF: 9 pages
Opt. Eng. 17(1) 170173 doi: 10.1117/12.7972182
Published in: Optical Engineering Volume 17, Issue 1
Show Author Affiliations
Roy W. Esplin, Utah State University (United States)


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