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Optical Engineering

Techniques for Evaluating Charge Coupled Imagers
Author(s): S. B. Campana
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Paper Abstract

Charge coupled imagers present special problems not encountered with beam-scanned sensors. This paper describes some of the instrumentation, procedures, and analyses used to evaluate charge coupled imagers. A simple analog technique for extracting signals from noise is discussed. Techniques are given for measuring and interpreting MTF (modulation transfer function), limiting resolution, temporal and spatial noise, image spreading, and image lag. Effects peculiar to CCDs (charge coupled devices) and CIDs (charge injection devices), such as aliasing and image smearing, are discussed.

Paper Details

Date Published: 1 June 1977
PDF: 8 pages
Opt. Eng. 16(3) 163267 doi: 10.1117/12.7972143
Published in: Optical Engineering Volume 16, Issue 3
Show Author Affiliations
S. B. Campana, Naval Air Development Center (United States)

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