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Optical Engineering

Detecting Impurities in Liquids with Moire Patterns
Author(s): R. G. Frieser; M. D. Reeber
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Paper Abstract

Shifts in a moire pattern projected through a liquid are used to evaluate contamination levels too low to be recognized by refractometry.

Paper Details

Date Published: 1 October 1977
PDF: 2 pages
Opt. Eng. 16(5) 165518 doi: 10.1117/12.7972126
Published in: Optical Engineering Volume 16, Issue 5
Show Author Affiliations
R. G. Frieser, IBM System Products Division (United States)
M. D. Reeber, IBM System Producis Division (United States)

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