Share Email Print

Optical Engineering

High-Speed Profile Measurement with Electro-Optics
Author(s): F. R. Reich; W. J. Coleman
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

A high-speed profile monitor has been developed for Frank-ford Arsenal as an integral part of an automatic 5.56 mm cartridge case ammunition inspection system. This profile gaging monitor uses a dual measurement station each with solid state linear diode arrays and shadow-imaging optics to achieve a throughput rate that exceeds 1200 cases/minute with a diameter measurement standard deviation better than ± 1.5 x 10-3 inch. Fourteen diameters and two lengths are measured on each cartridge case by separate gaging stations. Length measurements use a snapshot-type optical system while diameter measurements require both image tracking of the case shadow and scanning operation to get the diameter measurements from two diode array elements. A mini-computer with a direct memory input from the gaging stations provides an engineering unit conversion from the gaging stations and a dynamic accept/reject decision based on minimum accept and maximum accept limits.

Paper Details

Date Published: 1 February 1976
PDF: 4 pages
Opt. Eng. 15(1) 150144 doi: 10.1117/12.7971906
Published in: Optical Engineering Volume 15, Issue 1
Show Author Affiliations
F. R. Reich, Battelle Pacific Northwest Laboratories (United States)
W. J. Coleman, Battelle Pacific Northwest Laboratories (United States)

© SPIE. Terms of Use
Back to Top