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Optical Engineering

High Performance, Wide Bandwidth (Hg, Cd)Te Detectors
Author(s): V. J. Mazurczyk; R. N. Graney; J. B. McCullough
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Paper Abstract

The frequency dependence of responsivity and detector noise for (Hg,Cd)Te detectors operating in the 8-14 pm region at 77°K was investigated. The results showed that these quantities have the same frequency dependence and corner frequency. Values of f* were thus experimentally determined and found to be >10 MHz for detectors that have D*X - 5 X 1010 cm Hz% Watt-1. The results are shown to be consistent with a simple photoconductive theory based on the assumption of equal lifetimes for holes and electrons.

Paper Details

Date Published: 1 August 1974
PDF: 5 pages
Opt. Eng. 13(4) doi: 10.1117/12.7971711
Published in: Optical Engineering Volume 13, Issue 4
Show Author Affiliations
V. J. Mazurczyk, Honeywell Radiation Center (United States)
R. N. Graney, Honeywell Radiation Center (United States)
J. B. McCullough, Honeywell Radiation Center (United States)


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