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Optical Engineering

Film Sensitometry with Laser Sources
Author(s): John P. Fallon; Paul F. Kellen
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Paper Abstract

An instrument for performing film sensitometry with coherent sources is described. The instrument utilizes the diffraction properties of a periodic structure to generate an array of images at various energy levels. Relative measurements depend only on the properties of the optical system and are therefore very repeatable. Results are presented for exposures on 3404 film with a pulsed ruby laser.

Paper Details

Date Published: 1 April 1973
PDF: 5 pages
Opt. Eng. 12(2) 120275 doi: 10.1117/12.7971634
Published in: Optical Engineering Volume 12, Issue 2
Show Author Affiliations
John P. Fallon, Technical Operations, Incorporated (United States)
Paul F. Kellen, Technical Operations, Incorporated (United States)

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