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Optical Engineering

Thin Probe Pulsed Light Photometer
Author(s): LeRoy M. Dearing; Robert E. Hiller
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Paper Abstract

This paper describes a Thin Probe Pulsed Light Photometer for "direct" reading at the film plane. It represents an "order of magnitude" improvement in sensitivity, and measures pulsed light intensities to an accuracy of 5%. It is not affected by direct daylight, only pulsed light. Method of calibration and the practical use of this meter to test the timing performance of cameras on the range or track will be presented.

Paper Details

Date Published: 1 July 1968
PDF: 8 pages
Opt. Eng. 6(5) 605171 doi: 10.1117/12.7971400
Published in: Optical Engineering Volume 6, Issue 5
Show Author Affiliations
LeRoy M. Dearing, L. M. Dearing Associates, Inc. (United States)
Robert E. Hiller, L. M. Dearing Associates, Inc. (United States)

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