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Optical Engineering

A High Resolution, High Sensitivity Color Schlieren Method
Author(s): Paul H. Cords
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Paper Abstract

The sensitivity of three color schlieren methods currently used is limited because of diffraction inherently associated with them. A new method has been developed that has the same resolution capabilities as the commonly used black and white schlieren technique. At the same time the new method has sensitivity capabilities approaching that of the black and white technique. The paper illustrates both old and new methods and has photographs to compare sensitivity and resolution capabilities of each.

Paper Details

Date Published: 2 March 1968
PDF: 4 pages
Opt. Eng. 6(3) 060385 doi: 10.1117/12.7971376
Published in: Optical Engineering Volume 6, Issue 3
Show Author Affiliations
Paul H. Cords, U. S. Naval Ordnance Laboratory (United States)


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