Share Email Print
cover

Optical Engineering

Two High-Speed Dimensional Measuring Systems
Author(s): Till K. Dehmel
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Two high-speed, dimensional measurement systems have been developed. Both have several advantages over conventional measurement systems. Both have been designed around the use of line gratings. The first system measures and controls the flatness of opaque objects to a resolution of 100 microinches. The method is fast, non-contacting, self-calibrating, can be used in a limited access area, and can be applied to moving surfaces. The second system is used to measure and control the width of continuous opaque objects such as tapes. The method is noncontacting, minimizing frictional wear. One thousand measurements per second, at a resolution of 100 microinches, can be made.

Paper Details

Date Published: 1 March 1967
PDF: 4 pages
Opt. Eng. 5(3) 050391 doi: 10.1117/12.7971370
Published in: Optical Engineering Volume 5, Issue 3
Show Author Affiliations
Till K. Dehmel, International Business Machines Corp. (United States)


© SPIE. Terms of Use
Back to Top