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Optical Engineering

Growth of bismuth silicon oxide and bismuth germanium oxide crystals by the Czochralski technique and their characterization
Author(s): R. Gopalakrishnan; D. Krishnamurthy; Dakshanamoorthy Arivuoli; P. Ramasamy
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Paper Abstract

Photorefractive single crystals of bismuth silicon oxide (Bii2SiO2o) and bismuth germanium oxide (Bi12GeO2o) have been grown using the Czochralski technique. The experimental results are explained with the existing theoretical models. The grown crystals are characterized by x-ray, differential thermal analysis, scanning electron microscopy, IR transmission spectrum, and electron-probe microanalysis.

Paper Details

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Opt. Eng. 32(4) doi: 10.1117/12.61287
Published in: Optical Engineering Volume 32, Issue 4, April 1993
Show Author Affiliations
R. Gopalakrishnan, Anna Univ., Chennai (India)
D. Krishnamurthy, Anna Univ., Chennai (India)
Dakshanamoorthy Arivuoli, Anna Univ., Chennai (India)
P. Ramasamy, Anna Univ., Chennai (India)


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