Share Email Print
cover

Optical Engineering

Speckle imaging detector optimization and comparison
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Speckle imaging is a statistical technique for achieving near-diffraction-limited imagery of astronomical objects with ground-based telescopes. The performance of this statistical postdetection processing technique is critically dependent on the signal-to-noise ratio (SNR) of the estimators used for various average spectra, which can be a strong function of detector characteristics. We discuss techniques for maximizing SNR under low-light conditions where so-called "read noise" becomes a factor in CCD detectors, and we derive an optimal exposure time for CCD detection when total viewing time limits the SNR. We also show that a properly optimized CCD can outperform a shot-noise-limited detector, in terms of the SNR, at much lower light levels than without optimization.

Paper Details

Date Published: 1 April 1993
PDF: 6 pages
Opt. Eng. 32(4) doi: 10.1117/12.61195
Published in: Optical Engineering Volume 32, Issue 4
Show Author Affiliations
David W. Tyler, Phillips Lab. (United States)
Charles L. Matson, Seattle Pacific Univ. (United States)


© SPIE. Terms of Use
Back to Top