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Optical Engineering

High-accuracy critical angle refractometry
Author(s): Diana Tentori-Santa-Cruz; Carlos Lopez Famozo
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Paper Abstract

The measurement requirements of fifth-place refractometers based on the critical angle condition are analyzed. It is shown that the reference prism geometry limits the working interval of these instruments and that polarized light can be used to improve sensitivity.

Paper Details

Date Published: 1 March 1993
PDF: 9 pages
Opt. Eng. 32(3) doi: 10.1117/12.61047
Published in: Optical Engineering Volume 32, Issue 3
Show Author Affiliations
Diana Tentori-Santa-Cruz, CICESE (United States)
Carlos Lopez Famozo, CICESE/Fisica Aplicada (Mexico)


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