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Journal of Electronic Imaging

Analysis of random dithering patterns using second-order statistics
Author(s): Eran Steinberg; Robert J. Rolleston; Roger L. Easton
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Paper Abstract

An analytical approach is proposed to explain the appearance of unwanted low-frequency artifacts in halftoned images when using random dithering. The research is based on a theorem that relates the correlation of the input (continuous) gray-level signal to the correlation of the (halftone) binary output signal. This second-order statistical analysis alludes to the claim that the introduction of low-frequency artifacts is inevitable, being an intrinsic property of the dithering process rather than of individual images or masks. In addition, high-frequency information in the continuous image is attenuated more than low-frequency information. This effect is enhanced for mean gray levels farther from mid-gray.

Paper Details

Date Published: 1 October 1992
PDF: 9 pages
J. Electron. Imag. 1(4) doi: 10.1117/12.60717
Published in: Journal of Electronic Imaging Volume 1, Issue 4
Show Author Affiliations
Eran Steinberg, Electronics for Imaging Inc. (United States)
Robert J. Rolleston, Xerox Corp. (United States)
Roger L. Easton, Rochester Institute of Technology (United States)

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