Share Email Print
cover

Journal of Electronic Imaging

Analysis of random dithering patterns using second-order statistics
Author(s): Eran Steinberg; Robert J. Rolleston; Roger L. Easton
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An analytical approach is proposed to explain the appearance of unwanted low-frequency artifacts in halftoned images when using random dithering. The research is based on a theorem that relates the correlation of the input (continuous) gray-level signal to the correlation of the (halftone) binary output signal. This second-order statistical analysis alludes to the claim that the introduction of low-frequency artifacts is inevitable, being an intrinsic property of the dithering process rather than of individual images or masks. In addition, high-frequency information in the continuous image is attenuated more than low-frequency information. This effect is enhanced for mean gray levels farther from mid-gray.

Paper Details

Date Published: 1 October 1992
PDF: 9 pages
J. Electron. Imag. 1(4) doi: 10.1117/12.60717
Published in: Journal of Electronic Imaging Volume 1, Issue 4
Show Author Affiliations
Eran Steinberg, Electronics for Imaging Inc. (United States)
Robert J. Rolleston, Xerox Corp. (United States)
Roger L. Easton, Rochester Institute of Technology (United States)


© SPIE. Terms of Use
Back to Top