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Optical Engineering

Texture analysis by space-filling curves and one-dimensional Haar wavelets
Author(s): Sonlinh Phuvan; Tae Kwan Oh; Nicholas P. Caviris; Yao Li; Harold H. Szu
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Paper Abstract

1-D scan that follows the Peano curve to a desired resolution is demonstrated to preserve a 2-D proximity relationship and is shown to be efficient for wavelet transform (WT) processing and artificial neural network pattern recognition. This deterministic fractal sampling method can be implemented in real time using optoelectronic scanning. For example, 2-D texture patterns are analyzed by using 1 -D wavelet transformation. Those WT coefficients can be fed into a standard back-propagation neural network for pattern recognition.

Paper Details

Date Published: 1 September 1992
PDF: 8 pages
Opt. Eng. 31(9) doi: 10.1117/12.59957
Published in: Optical Engineering Volume 31, Issue 9
Show Author Affiliations
Sonlinh Phuvan, Naval Surface Warfare Ctr. (United States)
Tae Kwan Oh, Goldstar (United States)
Nicholas P. Caviris, U.S. Navy (United States)
Yao Li, NEC Research Institute, Inc. (United States)
Harold H. Szu, Naval Surface Warfare Ctr. (United States)

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