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Optical Engineering

Relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption of the recording medium
Author(s): Dahe Liu; Weiguo Tang; Wanyun Huang; Zhujian Liang
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Paper Abstract

The relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption coefficient of the recording medium was studied. The diffraction efficiency of a reflection hologram was found to increase monotonically with a decrease in the absorption coefficient a of the recording medium, but varies nonmonotonically with an increase of the thickness T of the recording medium. Maximum diffraction efficiency was obtained when T and α satisfied the relationship T= 1/α. Finally, we suggest a method to improve the quality of reflection holograms.

Paper Details

Date Published: 1 April 1992
PDF: 4 pages
Opt. Eng. 31(4) doi: 10.1117/12.56122
Published in: Optical Engineering Volume 31, Issue 4
Show Author Affiliations
Dahe Liu, Beijing Normal Univ. (China)
Weiguo Tang, Beijing Normal Univ. (China)
Wanyun Huang, Beijing Normal Univ. (China)
Zhujian Liang, Beijing Normal Univ. (China)


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