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Optical Engineering

Relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption of the recording medium
Author(s): Dahe Liu; Weiguo Tang; Wanyun Huang; Zhujian Liang
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Paper Abstract

The relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption coefficient of the recording medium was studied. The diffraction efficiency of a reflection hologram was found to increase monotonically with a decrease in the absorption coefficient a of the recording medium, but varies nonmonotonically with an increase of the thickness T of the recording medium. Maximum diffraction efficiency was obtained when T and α satisfied the relationship T= 1/α. Finally, we suggest a method to improve the quality of reflection holograms.

Paper Details

PDF: 4 pages
Opt. Eng. 31(4) doi: 10.1117/12.56122
Published in: Optical Engineering Volume 31, Issue 4, April 1992
Show Author Affiliations
Dahe Liu, Beijing Normal Univ. (China)
Weiguo Tang, Beijing Normal Univ. (China)
Wanyun Huang, Beijing Normal Univ. (China)
Zhujian Liang, Beijing Normal Univ. (China)


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