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Optical Engineering

Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit
Author(s): Gorden W. Videen; William L. Wolfe; William S. Bickel
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Paper Abstract

A ray-tracing model was used to derive the light scattering Mueller matrix element curves for a dipole near a perfect surface as a function of incident angle, scattering angle, and surface refractive index. This system represents a fundamental system composed of a perfect plane surface and a perfect (Rayleigh) scatterer.

Paper Details

Date Published: 1 February 1992
PDF: 9 pages
Opt. Eng. 31(2) doi: 10.1117/12.56076
Published in: Optical Engineering Volume 31, Issue 2
Show Author Affiliations
Gorden W. Videen, Dalhousie Univ. (United States)
William L. Wolfe, Univ. of Arizona (United States)
William S. Bickel, Univ. of Arizona (United States)


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