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Optical Engineering

Thermal scene projectors using microemitters
Author(s): Donald R. Stauffer; Barry E. Cole
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Paper Abstract

A number of techniques are under development for creating dynamic IR scenes for testing IR imaging systems. Comparison of these techniques may be misleading if appropriate performance parameters are not used. One straightforward method is the thermal emission from microemitters fabricated in an array. The small mass leads to good response times if crosstalk between elements and to any substrate can be limited. Silicon micromachining can create good performance in arrays of this type because of the excellent thermal isolation of the elements

Paper Details

Date Published: 1 November 1991
PDF: 4 pages
Opt. Eng. 30(11) doi: 10.1117/12.55991
Published in: Optical Engineering Volume 30, Issue 11
Show Author Affiliations
Donald R. Stauffer, Honeywell Systems and Research Ctr. (United States)
Barry E. Cole, Honeywell, Inc. (United States)

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