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Optical Engineering

Elimination of artifacts in interline charge-coupled devices imagers
Author(s): Bojan T. Turko; George J. Yates
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Paper Abstract

Charge-coupled devices (CCDs) of interline transfer design are especially useful in imaging at high frame rates. However, their sensitivity to ionization radiation and the reduced effective opacity of vertical charge transfer registers cause undesired image artifacts. Random white spots from the radiation and "ghost" images (or smear) generated in the registers may severely impair the image quality. An electronic method of eliminating these artifacts is described. Special sequences of pulses clock the CCD, quickly dumping the unwanted charge. The fast readout of images, cleared of artifacts, follows immediately. Results obtained with the Fairchild Weston CCD 222 imager are shown.

Paper Details

Date Published: 1 October 1991
PDF: 5 pages
Opt. Eng. 30(10) doi: 10.1117/12.55959
Published in: Optical Engineering Volume 30, Issue 10
Show Author Affiliations
Bojan T. Turko, Univ. of California (United States)
George J. Yates, Los Alamos National Lab. (United States)


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