Share Email Print

Optical Engineering

Elimination of systematic error in subpixel accuracy centroid estimation [also Letter 34(11)3347-3348(Nov1995)]
Author(s): Brian F. Alexander; Kim Chew Ng
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An analysis of the properties of the centroid method for subpixel accuracy image feature location is presented. This method is free of systematic error if the maximum spatial frequency of the image incident on the image sensor is less than the sensor's sampling frequency. This can be achieved by using a lens aperture setting such that the modulation transfer function cut-off frequency due to diffraction is appropriately small. Both simulation and experimental tests of this prediction are presented for the case of the location of the center lines of the images of projected light stripes in a triangulation-based three-dimensional shape measurement system.

Paper Details

Date Published: 1 September 1991
PDF: 12 pages
Opt. Eng. 30(9) doi: 10.1117/12.55947
Published in: Optical Engineering Volume 30, Issue 9
Show Author Affiliations
Brian F. Alexander
Kim Chew Ng, Monash Univ. (Australia)

© SPIE. Terms of Use
Back to Top