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Optical Engineering

High-resolution electron microscope image analysis approach for superconductor YBa2Cu307-x
Author(s): Jianhua Xu; Feng Lu; Chun-lin Jia; Zhongyi Hua
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Paper Abstract

An HREM (High-resolution electron microscope) image analysis approach has been developed. The image filtering, segmentation and partides extraction based on gray-scale mathematical morphological operations, are performed on the original HREM image. The final image is a pseudocolor image, with the background removed, relatively uniform brightness, filtered slanting elongation, regular shape for every kind of particle, and particle boundaries that no longer touch each other so that the superconducting material structure can be shown clearly.

Paper Details

Date Published: 1 September 1991
PDF: 4 pages
Opt. Eng. 30(9) doi: 10.1117/12.55942
Published in: Optical Engineering Volume 30, Issue 9
Show Author Affiliations
Jianhua Xu, Symbol Technologies, Inc. (United States)
Feng Lu, Fudan Univ. (China)
Chun-lin Jia, Fudan University (China)
Zhongyi Hua, Fudan Univ. (China)

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