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Optical Engineering

Effect of knife-edge skew on modulation transfer function measurement of charge-coupled device imagers employing a scanning knife edge
Author(s): Hon-Sum Philip Wong
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Paper Abstract

The scanning knife edge method is widely employed to measure the modulation transfer function (MTF) of solid state charge-coupled device (CCD) imagers. This paper presents a method to correct for the situation where the knife edge is skewed at a small angle with respect to the CCD. Experimental results for a time-delay-and-integration charge-coupled device (TDI-CCD) imager demonstrate that the knife-edge skew introduces a degradation in the measured MTF. A model to explain this effect and a quantitative method to correct for small-angle skew is presented. A good agreement between the model and experiment is obtained. In a TDI-CCD imaging system, the effect of small-angle skew is amplified and cannot be ignored.

Paper Details

Date Published: 1 September 1991
PDF: 5 pages
Opt. Eng. 30(9) doi: 10.1117/12.55941
Published in: Optical Engineering Volume 30, Issue 9
Show Author Affiliations
Hon-Sum Philip Wong, IBM Corp. (United States)

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