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Optical Engineering

Further observations of vectorial effects in the x-ray photoemission from cesium iodide
Author(s): George W. Fraser; John Ernest Lees; James F. Pearson
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Paper Abstract

We present further data on the linear polarization sensitivity of Csl x-ray/UV photocathodes. A radical physical origin-"nonlocal" photoemission-is proposed for the x-ray vectorial effect. Predictions from a uniaxial photocathode model are compared with measurements of (1) relative pulse quantum yields, relative current quantum yields, and electron number distributions for both s- (electric vector perpendicular to the plane of incidence) and p- (E parallel to the plane of incidence) polarized soft x rays in the wavelength range 4.6-125 Å; and (2) relative current quantum yields from illumination by partially polarized, broadband UV radiation with a modal wavelength of 1550 Å. An origin seated in the polarimeter geometry is also proposed for the off-axis "phase shift" phenomenon reported in previous papers. The impact of these measurements on (1) an understanding of soft x-ray interactions with materials, and (2) the design and sensitivity of the Spectrum X-Gamma photoemission polarimeter is discussed; our future plans for the investigation of photocathode physics are outlined.

Paper Details

Date Published: 1 August 1991
PDF: 14 pages
Opt. Eng. 30(8) doi: 10.1117/12.55919
Published in: Optical Engineering Volume 30, Issue 8
Show Author Affiliations
George W. Fraser, Univ. of Leicester (United Kingdom)
John Ernest Lees, Univ. of Leicester (United Kingdom)
James F. Pearson, Univ. of Leicester (United Kingdom)

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