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Optical Engineering

Subsurface flaw detection in reflective materials by thermal transfer imaging
Author(s): Xavier P. Maldague; Jean-Claude Krapez; Paolo G. Cielo
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Paper Abstract

A thermal imaging apparatus is described for the nondestructive detection of subsurface defects in materials that would not usually lend themselves to thermal imaging because of their low emissivity and high susceptibility to background reflection noise. This is accomplished by transferring the thermal image produced by surface temperature perturbation of the workpiece material to a high emissivity material with which it is continuously brought in contact. The transferred thermal image may be observed by a suitable infrared device, resulting in a high radiance image with minimum reflectivity or variable emissivity noise. Numerical simulations, as well as experimental results, are presented.

Paper Details

Date Published: 1 January 1991
PDF: 9 pages
Opt. Eng. 30(1) doi: 10.1117/12.55760
Published in: Optical Engineering Volume 30, Issue 1
Show Author Affiliations
Xavier P. Maldague, Univ. Laval (Canada)
Jean-Claude Krapez, National Research Council Canada (Canada)
Paolo G. Cielo, National Research Council Canada (Canada)

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