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Optical Engineering

Analysis of spatial pseudodepolarizers in imaging systems
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Paper Abstract

The objective of a number of optical instruments is to measure the intensity accurately without bias as to the incident polarization state. One method to overcome polarization bias in optical systems is the insertion of a spatial pseudodepolarizer. Both the degree of depolarization and image degradation (from the polarization aberrations of the pseudodepolarizer) are analyzed for two depolarizer designs: (1) the Cornu pseudodepolarizer, effective for linearly polarized light, and (2) the dual Babinet compensator pseudodepolarizer, effective for all incident polarization states. The image analysis uses a matrix formalism to describe the polarization dependence of the diffraction patterns and optical transfer function.

Paper Details

Date Published: 1 December 1990
PDF: 7 pages
Opt. Eng. 29(12) doi: 10.1117/12.55756
Published in: Optical Engineering Volume 29, Issue 12
Show Author Affiliations
James P. McGuire, Jet Propulsion Lab. (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)


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