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Optical Engineering

Through-thickness mark length variations in laser-irradiated thin films
Author(s): Brian Josef Bartholomeusz; George R. Olin
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Paper Abstract

Low-conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of significant through-thickness thermal gradients. A combined Laplace-transform, Fourier-integral method was used to derive the temperature distributions in such films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. The results were in good qualitative agreement with experimental observations.

Paper Details

Date Published: 1 August 1990
PDF: 5 pages
Opt. Eng. 29(8) doi: 10.1117/12.55665
Published in: Optical Engineering Volume 29, Issue 8
Show Author Affiliations
Brian Josef Bartholomeusz, Eastman Kodak Co. (United States)
George R. Olin, Eastman Kodak Co. (United States)


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