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Optical Engineering

Design and analysis of a Schwarzschild imaging multilayer x-ray microscope
Author(s): David L. Shealy; Richard B. Hoover; Troy W. Barbee; Arthur B. C. Walker
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Paper Details

Date Published: 1 July 1990
PDF: 7 pages
Opt. Eng. 29(7) doi: 10.1117/12.55656
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
David L. Shealy, Univ. of Alabama/Birmingham (United States)
Richard B. Hoover
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Arthur B. C. Walker, Stanford Univ. (United States)


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