Share Email Print

Optical Engineering

Advances in multilayer x-ray/EUV optics: synthesis, performance, and instrumentation
Author(s): Troy W. Barbee
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The field of multilayer optics for the x-ray, soft x-ray and extreme ultraviolet wavelengths is maturing at a rapid pace. There are more than forty groups worldwide actively working in this area. A large part of these efforts is directed to improving the quality of multilayer structures by developing a better understanding of the synthesis-structure-property relationship. Although the quality of multilayer structures may be substantially improved, there are now significant instrumental applications for these reflecting optics. In this paper the current status of this field is discussed.

Paper Details

Date Published: 1 July 1990
PDF: 10 pages
Opt. Eng. 29(7) doi: 10.1117/12.55655
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
Troy W. Barbee, Lawrence Livermore National Lab. (United States)

© SPIE. Terms of Use
Back to Top