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Optical Engineering

Evaluation of a PtSi infrared camera
Author(s): James E. Murguia; Jonathan Martin Mooney; William S. Ewing
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Paper Details

Date Published: 1 July 1990
PDF: 9 pages
Opt. Eng. 29(7) doi: 10.1117/12.55653
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
James E. Murguia, U.S. Air Force (United States)
Jonathan Martin Mooney, Rome Lab. (United States)
William S. Ewing, Texas Instruments Inc. (United States)

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