Share Email Print

Optical Engineering

Electronic speckle pattern interferometry system for in situ deformation monitoring on buildings
Author(s): Gerd Guelker; Klaus D. Hinsch; Claudia Hoelscher; A. Kramer; H. Neunaber
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

An electronic speckle pattern interferometry system has been developed for in situ measurements of microdeformations on buildings or monuments. Design of the optomechanical setup received special attention to allow firm and steady contact between object and optical head. Features are the miniaturization of the light source (laser diode) and pickup (CCD camera). Image processing was carried out with a personal computer. Deformation monitoring was demonstrated successfully over periods of several weeks in the study of decay mechanisms of walls in an historic church.

Paper Details

Date Published: 1 July 1990
PDF: 5 pages
Opt. Eng. 29(7) doi: 10.1117/12.55648
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
Gerd Guelker, Univ. Oldenburg (Germany)
Klaus D. Hinsch, Univ. Oldenburg (Germany)
Claudia Hoelscher, Univ. Oldenburg (Germany)
A. Kramer, Carl-von-Ossietzky Univ. (Germany)
H. Neunaber, Spectradata GmbH (Germany)

© SPIE. Terms of Use
Back to Top