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Optical Engineering

Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishing
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Paper Abstract

The performance of multilayer x-ray mirrors is improved by smoothing the boundaries within the multilayer stack with ion bombardment at grazing angles of incidence. The process is applied to Co-C and to RhRu-C mirrors for normal incidence telescopes at ? = 63.5 and 114 Å, and the reflectivity is increased by a factor of 2 in both cases. Accumulation of roughness during deposition is eliminated. An estimate of the presently achievable reflectivity for normal incidence mirrors in the ? = 44 to 120 Å wavelength range is given.

Paper Details

Date Published: 1 June 1990
PDF: 5 pages
Opt. Eng. 29(6) doi: 10.1117/12.55642
Published in: Optical Engineering Volume 29, Issue 6
Show Author Affiliations
Eberhard Adolf Spiller, IBM Corp. (United States)

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