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Optical Engineering

Refractometry by minimum deviation: accuracy analysis
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Paper Abstract

We analyze the accuracy achieved when evaluating high refractive indices by minimum deviation deflectometry.

Paper Details

Date Published: 1 February 1990
PDF: 9 pages
Opt. Eng. 29(2) doi: 10.1117/12.55573
Published in: Optical Engineering Volume 29, Issue 2
Show Author Affiliations
Diana Tentori-Santa-Cruz, CICESE (United States)
Jesus R. Lerma, CICESE (United States)


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