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Optical Engineering

Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry
Author(s): Pierre R. Slangen; Christophe De Veuster; Yvon L. M. Renotte; Leon Berwart; Yves F. Lion
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Paper Abstract

A phase-shifting digital speckle pattern interferometer (DSPI) has been calibrated using a Michelson interferometer. Calibration consists in measuring phase shifts generated by piezoelectric transducers (PZTs) and also to determine drift of the phase with time in the interferometer arms. The calibration fringes are displayed live on the TV monitor and then processed slice by slice after recombination following their recording sequence (PZT voltage or time). Dark fringes are detected to compute the wavelength with good accuracy (λ/170 theoretical) and the optical path difference is stored in a datasheet for every slice. This leads to the measurements of the drift and the calibration of the phase shifters with an accuracy about λ/20. Out-of-plane and in-plane optical fiber DSPIs have been successfully characterized using the same algorithm. The method presented also enables inexpensive data processing. Moreover the real-time measurement of the interferometer drift enables feedback loop active control during DSPI measurements.

Paper Details

Date Published: 1 December 1995
PDF: 5 pages
Opt. Eng. 34(12) doi: 10.1117/12.215666
Published in: Optical Engineering Volume 34, Issue 12
Show Author Affiliations
Pierre R. Slangen, Univ. de Liege (Belgium)
Christophe De Veuster, Univ. de Liege (Belgium)
Yvon L. M. Renotte, Univ. de Liege (Belgium)
Leon Berwart, Univ. de Liege (Belgium)
Yves F. Lion, Univ. de Liege (Belgium)


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