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Optical Engineering

Aliasing reduction in staring infrared imagers utilizing subpixel techniques
Author(s): Joseph C. Gillette; Thomas M. Stadtmiller; Russell C. Hardie
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Paper Abstract

We introduce and analyze techniques for the reduction of aliased signal energy in a staring infrared imaging system. A standard staring system uses a fixed two-dimensional detector array that corresponds to a fixed spatial sampling frequency determined by the detector pitch or spacing. Aliasing will occur when sampling a scene containing spatial frequencies exceeding half the sampling frequency. This aliasing can significantly degrade the image quality. The aliasing reduction schemes presented here, referred to as microscanning, exploit subpixel shifts between time frames of an image sequence. These multiple images are used to reconstruct a single frame with reduced aliasing. If the shifts are controlled, using a mirror or beam steerer for example, one can obtain a uniformly sampled microscanned image. The reconstruction in this case can be accomplished by a straightforward interlacing of the time frames. If the shifts are uncontrolled, the effective sampling may be nonuniform and reconstruction becomes more complex. A sampling model is developed and the aliased signal energy is analyzed for the microscanning techniques. Finally, a number of experimental results are presented that illustrate the perlormance of the microscanning methods.

Paper Details

Date Published: 1 November 1995
PDF: 8 pages
Opt. Eng. 34(11) doi: 10.1117/12.213590
Published in: Optical Engineering Volume 34, Issue 11
Show Author Affiliations
Joseph C. Gillette, Technology/Scientific Services, Inc. (United States)
Thomas M. Stadtmiller, Technology/Scientific Services, Inc. (United States)
Russell C. Hardie, Univ. of Dayton (United States)


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