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Optical Engineering

M-line spectroscopy for nonlinear characterization of polymeric waveguides
Author(s): Guy Vitrant; Raymond Reinisch; Francois Kajzar
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Paper Abstract

Nonlinear M-line spectroscopy is based on the analysis of the nonlinear change in the shape of the dark line associated with the excitation of guided waves. This is an easy technique for the determination of Kerr properties of thin films, which can constitute optical waveguides. Full spatiotemporal nonlinear modeling tools have been developed recently for nonlinear waveguide couplers, which are used for the determination of the complex nonlinear coefficient of organic polymers.

Paper Details

Date Published: 1 December 1995
PDF: 9 pages
Opt. Eng. 34(12) doi: 10.1117/12.213240
Published in: Optical Engineering Volume 34, Issue 12
Show Author Affiliations
Guy Vitrant, LEMO-ENSERG (France)
Raymond Reinisch, ENSERG (France)
Francois Kajzar, CEA-Technologies Avancees (France)

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