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Optical Engineering • Open Access

Guest Editorial: Polarization Analysis and Measurement

Paper Abstract

This PDF file contains the editorial “Guest Editorial: Polarization Analysis and Measurement” for OE Vol. 34 Issue 06

Paper Details

Date Published: 1 June 1995
PDF: 2 pages
Opt. Eng. 34(6) doi: 10.1117/12.210267
Published in: Optical Engineering Volume 34, Issue 6
Show Author Affiliations
Dennis H. Goldstein, Air Force Wright Lab. (United States)
David B. Chenault, Nichols Research Corp. (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

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