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Optical Engineering

Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns
Author(s): Maria Pirga; Malgorzata Kujawinska
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Paper Abstract

Various interferometric and fringe projection techniques may result in crossed and closed fringe patterns with the information about the phenomena tested. Recent applications require the analysis on the basis of a single fringe pattern. Here, we address two problems: simultaneous analysis of the information about two events, and analysis of fringe pattern with high phase gradients in both x and y directions. The analysis of a fringe pattern is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the method in reference to both problems is presented.

Paper Details

Date Published: 1 August 1995
PDF: 8 pages
Opt. Eng. 34(8) doi: 10.1117/12.207112
Published in: Optical Engineering Volume 34, Issue 8
Show Author Affiliations
Maria Pirga, Warsaw Univ. of Technology (Poland)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)

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