Share Email Print

Optical Engineering

Mueller matrix imaging polarimetry
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The design and operation of a Mueller matrix imaging polarimeter is presented. The instrument is configurable to make a wide variety of polarimetric measurements of optical systems and samples. In one configuration, it measures the polarization properties of a set of ray paths through a sample. The sample may comprise a single element, such as a lens, polarizer, retarder, spatial light modulator, or beamsplitter, or an entire optical system containing many elements. In a second configuration, it measures an optical system's point spread matrix, a Mueller matrix relating the polarization state of a point object to the distribution of intensity and polarization across the image. The instrument is described and a number of example measurements are provided that demonstrate the Mueller matrix imaging polarimeter's unique measurement capability.

Paper Details

Date Published: 1 June 1995
PDF: 11 pages
Opt. Eng. 34(6) doi: 10.1117/12.206161
Published in: Optical Engineering Volume 34, Issue 6
Show Author Affiliations
J. Larry Pezzaniti, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

© SPIE. Terms of Use
Back to Top